Focused Ion Beam (FIB) is a special interest group of the Australian Microscopy and Microanalysis Society (AMMS).

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FIB focuses on all aspects related to the application and advancement of Focused Ion Beam (FIB) technology in various scientific disciplines.

 

Focused Ion Beam technology involves the use of a finely focused beam of ions to interact with samples at the nanoscale level. This powerful technique enables researchers to perform precise milling, cutting, deposition, imaging, and analysis of materials and biological samples. FIB is utilised in diverse fields, including materials science, electronics, semiconductor manufacturing, biology, geology, etc.

 

FIB special interest group aims to foster collaboration, knowledge sharing, and skill development among FIB users and researchers. The group acts as a platform for scientists, engineers, and enthusiasts to connect, exchange ideas, and showcase their latest findings related to FIB applications and methodologies.