AMAS X - Workshops

[ amasx@adelaide.edu.au ]

Workshop schedule

AMAS X workshops will be held at primarily at the University of Adelaide on the 9^th, 10^th and 14^th of February. Ten workshops are on offer:

Monday, February 9
Morning (9:00am to 12:30pm)	Analytical TEM
Afternoon (1:30pm to 5:00pm)	Focussed Ion Beam (FIB)	Electron Probe Micro-Analysis (EPMA)
All day (9:00am to 5:00pm)	SEM Microanalysis
Tuesday, February 10
Morning (9:00am to 12:30pm)	Cathodoluminescence
Afternoon (1:30pm to 5:00pm)	Electron Backscatter Diffraction (EBSD)
All day (9:00am to 5:00pm)	Scanned Probe	Forensic Microscopy
Saturday, February 14 (post-symposium)
All day (9:00am to 5:00pm)	LA-ICPMS

Note: Workshop participants are required to nominate their sessions on the registration form.

Monday the 9th of February

Morning session - 9:00am to 12:30pm

Analytical TEM

Coordinators	Nestor J. Zaluzec (Argonne National Laboratory), Lyn Waterhouse (The University of Adelaide)
Session	Monday morning
Location	University of Adelaide
Presenter	Nestor J. Zaluzec (Argonne National Laboratory).
Description	The intent of this workshop/short course will be both review and forward looking in nature. We will discuss both X-ray and Electron Loss spectroscopies in the modern Analytical EM. We will cover the current status of instrumentation, analysis, pitfalls and examples of use as well as consider future prospects. It will serve as a good introduction to the techniques for the novice as well as a refresher for those who are returning to the field. If sufficient interest and opportunities exists then on Monday afternoon we will attempt to arrange demos on available instrumentation at the University of Adelaide.

Afternoon session - 1:30pm to 5:00pm

Focusssed Ion Beam (FIB)

Coordinator	Len Green (Adelaide Microscopy)
Session	Monday afternoon
Location	University of Adelaide
Presenters	Dr Julie Cairney (University of Sydney) and Len Green (Adelaide Microscopy)
Description	FIB users will discuss: how a FIB works; what a FIB can and cannot do; using FIB with EDSX and EBSD and other FIB applications. There will be a visit to Adelaide Microscopy’s Helios Nanolab for those interested.

Electron Probe Micro-Analysis (EPMA)

Coordinators	John Terlet (Adelaide Microscopy).
Session	Monday afternoon
Location	University of Adelaide
Presenters	Paul Carpenter (Washington University, Missouri), John Terlet (Adelaide Microscopy).
Description	To be provided

All day session - 9:00am to 5:00pm

SEM Microanalysis

Coordinator	John Ward (Materials Science and Engineering, CSIRO, Clayton)
Session	Monday, all day
Location	University of Adelaide
Presenters	Bob Anderhalt, Raynald Gauvin, Brendan Griffin, Peter Miller, Julie Sheffield-Parker, John Ward, Nestor Zaluzec
Description	Peter Miller (MCEM) Intro- specimen interaction, SE, BSE, X-ray continuum, characteristic X-rays, etc Absorption, secondary fluorescence SEM artefacts Specimen prep, coatings Raynald Gauvin Matrix corrections, ZAF etc Monte Carlo modelling Interaction volumes Bob Anderhalt (EDAX) Calibration and how often? Tungsten, FESEM Low kV/ High KV Advantages/ disadvantages of each When you would choose to use each Julie Sheffield-Parker (Oxford) Detector Technology – solid angle, take- off, incidence angle, windowless, Be, atmospheric thin Spectral resolution Background Brendan Griffin (UWA) ESEM Light element analysis Specimen preparation for light element analysis Avoiding contamination for light element analysis Advanced Julie Sheffield-Parker (Oxford) Qualitative analysis Qualitative mapping Artefacts, escape peaks, sum peaks, etc Nestor Zaluzec (Argonne National Laboratory) EDS in TEM Specimen preparation for EDS in TEM Applications Bob Anderhalt (EDAX) Biological, fixation (low temperature analysis) Material Particle Thick and thin sample analysis Brendan Griffin (UWA) Quantitative analysis Quantitative analysis of light elements – how good is it? Quantitative mapping Comparison/advantages, disadvantages of ED and WD

Tuesday the 10th of February

Morning session - 9:00am to 12:30pm

Cathodoluminescence microscopy

Coordinator	Colin MacRae (CSIRO Minerals)
Session	Tuesday morning
Location	University of Adelaide
Presenters	To be announced
Description	The aim of this workshop is to introduce participants to: Cathodoluminescence generation – Intrinsic & Extrinsic Influences to cathodoluminescence – Stress, strain, dopant level, crystal orientation Types of detection systems – Flood Gun, SEM based Scanning spectrometers vs. CCD types Methods for identifying transitions responsible for peaks in cathodoluminescence spectra will be covered, together with: Calibration of detectors Spectroscopy Deconvoluting peaks – OpticalFit software Introduction to the Luminescence Database online resource. Linear response of signal – How to test for it and what is required of your system The application of cathodoluminescence to the study of Minerals and Materials shall be covered with a range of samples.

Afternoon session - 1:30pm to 5:00pm

Electron Back-Scatter Diffraction (EBSD)

Coordinator	Julie Sheffield-Parker (Oxford Instruments Nanoanalysis)
Session	Tuesday afternoon
Location	University of Adelaide
Presenters	Julie Sheffield-Parker (Oxford Instruments Nanoanalysis)
Description	This workshop is an introduction to Electron Backscatter Diffraction (EBSD) and its applications. EBSD is a quantitative SEM based technique which uses crystallographic information to determine micro-structural information such as grain size, grain boundary character, grain orientation, texture and phase identity on a micron and sub-micron scale. In this workshop we will review the theory and applications of the technique. Practical demonstrations will also be included.

All day session - 9:00am to 5:00pm

Scanned probe microscopy

Coordinator	Chris Gibson (Flinders University)
Session	Tuesday, all day
Location	Flinders University
Presenters	Chris Gibson (Flinders University)
Description	The focus of the workshop will be: the application of atomic force microscopy to force volume imaging carbon nanotube attachment to AFM probes and lithography. We will also demonstrate confocal Raman microscopy which can provide chemical information at sub micron resolution on a variety of surfaces including carbon nanotubes and mixtures of polymers such as polystyrene and Poly(methyl methacrylate).

Forensic microscopy

Coordinators	Richard Wurher (University of Technology, Sydney) and Ivan Sarvas (Forensic Science, Adelaide)
Session	Tuesday, all day
Location	The University of Adelaide
Presenters	Richard Wuhrer, Ivan Sarvas, Prof H J Kobus, Vincent Otieno-Alego, Paul Kotula and Rob Fitzpatrick
Description	Prof H J Kobus (Forensic Unit, Flinders University) Practical Forensic Applications of SEM/EDX analysis in the last thirty years. Richard Wuhrer, Material Scientist, University of Technology, Sydney Introduction to current and future technologies in scanning electron microscopy, environmental and variable pressure scanning electron microscopy, detectors etc. Particle and gunshot residue analysis and X-ray mapping Ivan Sarvas, Senior Technical Officer, FSSA, Adelaide Introduction to firearms, gunshot residue particles, environmental particles and controversies. Vincent Otieno-Alego, Chemical Criminilistic, Australian Federal Police Raman-SEM analysis and its application to Forensic Science. Paul Kotula, Principal member of Tech. Staff, Materials Characterization Dept. Sandia National Laboratories, Albuquerque, New Mexico STEM/EDS spectral imaging & multivariate statistical analysis of B. anthracis. Dr Rob Fitzpatrick, Soil Forensic Expert, Director for Centre for Australian Forensic Soil Science, CSIRO Soil analysis and its application to Forensic Science by SEM/EDX

Saturday the 14th of February

Morning session - 9:00am to 12:30pm

LA-ICPMS

Coordinator	Angus Netting (University of Adelaide)
Session	Saturday, all day
Location	University of Adelaide
Presenters	Leonid Danyushevsky (University of Tasmania), Sarah Gilbert (UTas), Fred Fryer (Agilent Technologies), Dominic Hare (UTS).
Description	Introduction to ICPMS — Fred Fryer Basics of ICP-MS, differences between tuning associated with dry and wet plasma conditions etc. Preparations for solution analysis — Sarah Gilbert Preparing solid samples via digestion, dilution and calibration for solution ICP-MS. Methodology for calibration. LA-ICPMS — Leonid D Main differences between solution- and LA- ICPMS Laser systems for Laser ablation. Which lasers are best used for different materials and why. Ablation cells What happens in an ablation cell, the effect of volume, what pitfalls exist and how to overcome them. Interface between the Laser Ablation system and the ICPMS Tuning for dry plasma (what to look for) Quantification Standards. Primary, Secondary; matrix matching. Data reduction software Spots versus Lines. Advantages and disadvantages. Specific Applications. Brain mapping — Dominic Hare (UTS)