Program
Day One Tuesday – 18th February
8:30 Registration – Computer Science Theater
1 (Map Ref
P 10)
9:15 Welcome Address and Opening – Colin MacRae
Session 1 Microanalysis – future directions
Chair: Colin MacRae
9:20 Automated Spectral Image Analysis: The Next Generation of Microanalysis and Beyond
P.G. Kotula and M.R. Keenan
10:00 Australian Facilities for Synchrotron Microanalysis
R. Garrett
10:40 Morning Tea
Session 2 Surface Analysis
Chair: Marion Stevens-Kalceff
11:20 Contemporary surface chemical analysis techniques: TOF-SIMS and XPS
P. Pigram.
11:50 Characterisation of interfacial segregation using auger electron spectroscopy
J du Plessis
12:10 Recent developments in x-ray detectors for the SEM
R. Anderhalt
12:30 Platinum “opal eyes” – an upgraded high resolution imaging standard for performance monitoring of FEG SEM and FEG VPSEM
B. J Griffin
12:50 Lunch – Foyer Computer Science Theater 1
Session 3 Major Facilities I
Chair: Mike Horne
2:00 Accessing the Nanostructural Analysis Network Organisation (NANO)
R. Hicks and S. Ringer
2:30 Sharing Microscopy Infrastructure - What, Why, How?
S. Stowe
2:50 Focused Ion Beams: Present and Future Technologies.
S. Prawer and D. N. Jamieson
3:20 Afternoon Tea
Session 4 Art
Chair: Paul Kotula
4:00 The art in science: electron microscopy and paintings conservation
L. Waters
4:20 TEM-SEM preparation . Materials specimen preparation using ultramicotomy.
S. Glanville and G. Theodossiou
4:40 Conservation of 19th and early 20th century oil paintings – in situ studies using the environmental scanning electron microscope
R. White, M. Phillips, P. Thomas, P. Dredge and R. Wuhrer
5.00 AMMS AGM
6:00 Barbecue, St Mary’s College, Sponsored by Oxford Instruments
Featuring the Harrowfield Players
Day Two Wednesday – 19th February
Session 1 EPMA
Chair: Chris Ryan
9:00 Tomographic spectral imaging: Microanalysis in 3D
P.G. Kotula, M.R. Keenan, and J.R. Michael
9:40 Characterisation of chrome-spinel grains in ilmenite concentrates using combined EPMA imaging and analysis methods.
M I Pownceby, C M MacRae, and N C Wilson
10:00 Combined EDS-WDS analysis revisited
N. G. Ware
10:20 Electron microprobe analysis of Ti in sulphide close to iron-titanates grain boundaries: Overcoming the problem of secondary X-ray fluorescence
C. M. MacRae and I. Grey
10:40 Cathodoluminescence mapping - Optimising collection conditions and examples of applications to minerals and mineral processing
N.C. Wilson, C.M. MacRae and R. Lynch
11:00 Morning Tea
Session 2 TEM (I)
Chair: Dougal McCulloch
11:20 Recent Development in Analytical Methodology on the ANL 300 kV Instrument.
N. J. Zaluzec
11:50 Crystal analysis using HOLZ contrast
C. Rossouw
12:10 The Dependence of Preferred Orientation with inbuilt stress in Titanium Nitride thin films
S.H.N. Lim, D.G.McCulloch, M.M.M.Bilek, D.R.McKenzie
12:30 Lunch – Foyer Computer Science Theater 1
1:00 (AMAS Executive meeting – Computer Science Theater 1)
Session 3 Microanalysis
Chair: Nick Ware
2:00 The impact of irradiation induced specimen charging on microanalysis in a scanning electron microscope
M. A. Stevens-Kalceff
2:20 A comparison of duane-hunt limits and elemental L:K ratios as measures of charging in non-conductive samples
B. J Griffin
2:40 Fluid inclusion analysis by nuclear microprobe
C. Ryan
3:00 Focused probes of high energy ions – versatile analytical probes for materials and devices
D. Jamieson
3:20 Afternoon Tea
Session 4 Applications
Chair: Nestor Zaluzec
4:00 Analytical characterisation of titanium borate formation by many, many techniques
A. Torpy, C. M. MacRae, M. Nagle, J. du Plessis, D. M. McCulloch
4:20 A technique for imaging the morphology of nano-crystalline compounds formed on electrode surfaces in electrochemical experiments.
A K Neufeld
4:40 Application of microscopy methods to the understanding of mechanisms involved in ilmenite reduction by hydrogen
M. de Vries, J. Fitzgerald, I. Grey
5:00 AMAS OGM
7:00 Conference Dinner
– Il Vicolo, Sponsored by Nanotechnology Systems
Day Three Thursday – 20th February
Session 1 TEM (II)
Chair: Nick Wilson
9:00 Simulation of cross sections for practical alchemi
L. J. Allen and M. P. Oxley
9:20 Applications of energy-filtered tem to the study of element distributions in nano-scale materials
M. Saunders
9:40 Atomic resolution electron energy loss spectroscopy imaging in an aberration corrected stem
S. D. Findlay, L. J. Allen and M. P. Oxley
10:00 Composition and bonding in nanoscale cu/cr multilayers
V. J. Keast
10:20 Electron microscopy of Chytridiomycosis and the need to re-examine the disease from the gene to the cell
A. Hyatt
10:40 Evaluation of the GIF 2000 at RMIT
D.G. M. McCulloch, T.C. Petersen, S.K. Toh, S.H.N. Lim, M.M.M. Bilek and D.R. McKenzie
11:00 Morning Tea
Session 2 Instrumentation
Chair: Martin Saunders
11:20 X-ray microtomography: applications and developments
P. Self, J. Terlet and P. Thomson
11:50 Recent Developments in simultaneous EDS/EBSD
R. Anderhalt
12:10 Digital Imaging for microscopy
C. Sapounas
12:30 X-ray projection microscopy in the SEM
P. Miller
12:50 Lunch – Foyer Computer Science Theater 1
Session 3 Chair: Brendan Griffin
1:30 Neutron Beam Facilities at Australia’s Replacement Research Reactor
R. A. Robinson
2:10 Mineral dating using the EPMA: trials and tribulations
D. A. Steele
2:30 Microcharacterisation of localised potentials induced in non-conductive materials during focused ion beam milling
M. A. Stevens-Kalceff, S. Rubanov and P. R. Munroe
2:50 Afternoon Tea
Session 4 Chair: Peter Miller
3:10 Correct specimen preparation for microstructure analysis
M. Donaghy
3:30 Determination of Noise Due to SE BSE Emission
S. Kok
3:50 Chromatic Aberration as a Tool for High Precision Surface Analysis
M. H. Greaves, K. D. Hands, D. G McCulloch, W. D. Raverty, N. Vanderhoek and J. V Ward
4:10 Closing remarks