PALM Microdissection workshop (WU-07) "Laser microdissection technology allows the molecular analysis of individual cells within tissue specimens. Microdissection of individual and pure cell populations from tissue specimens involves the coordinated use of microscopic, laser and robotic techniques to localise, dissect and capture cellular or subcellular material. This workshop will be based around hands-on work with a PALM laser microdissector with some discussion of sample preparation and downstream techniques for recovery of RNA, DNA and protein. There will also be some opportunity for participants to work with their own samples."

X-ray Mapping Workshop (WU-05)
"X-ray mapping using energy dispersive spectroscopy or wavelength dispersive spectroscopy is a very popular characterisation tool for determining the elemental distribution in materials. Furthermore, quantitative X-ray mapping has become a very powerful technique enabling reliable quantitative results that can be an order of magnitude better than traditional analysis. Quantitative X-ray mapping is also far superior to regions of interest X-ray maps where low levels of an element or elemental overlaps are present. The use of high speed silicon drift detectors (SDD) and multi-detectors allows improvement in performance at low levels without compromising quantification quality and precision of traces, even in the presence of overlaps. This workshop is an introduction to x-ray mapping and the current changes that are occurring that allow for the rapid x-ray mapping of materials. The workshop will be discussing elemental mapping and a number of post-processing methods such as pseudo colouring, scatter diagram creation, quantitative mapping and chemical phase mapping all of which aid in obtaining a better understanding of a materialís chemical and microstructural properties."

FIB workshop (WU-18)
"This course will first introduce the important ion beam-specimen interactions that make the focused ion beam tool so useful in a modern micro-characterization laboratory. The various specimen preparation techniques will then be discussed including preparation of samples for SEM, TEM and atom probe. This section will be accompanied by many examples of applications from the lecturer's laboratories. A laboratory section is planned, example applications will be demonstrated on the FEI Nova NanoLab located in the North Campus Electron Microbeam Analysis Laboratory at the University of Michigan, in Ann Arbor Michigan. Connection to Ann Arbor will be via advanced next generation internet technologies."

FLIM workshop (WU-21)
"The workshop will start with a theoretical introduction about FLIM. It will be explained how the Becker and Hickel FLIM system works together with the Leica TCS. After the introduction we will perform lifetime measurements at the Leica system. We encourage participants to bring their own samples to try at the workshop and discuss the results. The workshop will be conducted by Dr. Carola Thoni."