S-01 AMMRF - Showcase of Facilities
The Australian Microscopy and Microanalysis Research Facility (AMMRF) was established in 2007 under the National Collaborative Research Infrastructure Scheme (NCRIS). The Facility is a co-ordinated approach to maintaining excellence in Australian microscopy and microanalysis infrastructure and it assembles and links a major proportion of the tertiary and government sector microscopy infrastructure into a single seamless entity, to the users. Presentations will be made on the new resources, existing flagships from the NANO MNRF precursor, and access paths.
S-02 Advances in Quantitative Microstructural (EBSD) Analysis in Synthetic and Natural Materials
EBSD is an analytical technique used for phase and orientation characterization of crystalline materials. Over recent years, the application of EBSD has grown dramatically and this has driven major advances in the science. The aim of this session is to bring together researchers with a common interest in EBSD to showcase exciting advances in their particular field. In so doing, the session will illustrate discipline-specific advances that have potentially wider application across a broad range of scientific disciplines. We welcome contributions from all EBSD enthusiasts but particularly encourage research students and early career researchers to present their results. Joe Michael (Sandia National Laboratory) will give the keynote presentation.
S-03 Visualising and Modelling Biological Complexity in 3D across Scales and Resolutions
The volume and diversity of 3D image data collected from cells has increased dramatically through advances in microscopy and computer technology over the past decade. Viewing and interpreting large and complex 3D datasets across a spectrum of scale and resolution in a way that provides the biomedical researcher and bioinformatician with rapid insights into normal versus abnormal cell physiology still presents unique challenges that require specialised visualisation and modeling solutions. A plenary presentation by Mark Ellisman (National Center for Microscopy and Imaging Research, University of California - San Diego), accompanied by keynote presentations by Peter Hunter (Auckland Bioengineering Institute, University of Auckland) and Johanna Hoog (European Molecular Biology Laboratory, Germany) will cover a number of exciting approaches for visualising and modeling complex biological phenomena from molecule-to-cell and from cell-to-tissue.
S-04 FIB Developments and Applications
Focused ion beam (FIB) instrumentation can be used in a wide range of applications in microscopy and associated disciplines. This includes the direct observation of specimen substructure, including those using analytical methods such as EDS and EBSD, the preparation of TEM specimens from complex materials, the generation of 3D visualizations and the use of ion beams in nanofabrication. Joe Michael from Sandia National Laboratories has been invited to present an overview of recent developments in the application of FIB. Contributions on all aspects of FIB-based microscopy and fabrication are welcomed.
S-05 IUMAS Presidential Symposium on X-ray Microanalysis
This symposium is organized by the co-host of the conference, IUMAS. It currently is comprised of four invited presentations given by eminent microbeam analysts who have been nominated by the member Societies. The core topics are new developments in Monte Carlo simulations of X-ray spectrum (Raynald Gauvin, McGill University, Canada), depth-profiling analysis with FIB-EPMA (Silvia Richter, Rhein Westphalische Technische Hochschule (RWTH), Germany), improvements of X-ray analysis of thin-films in aberration-corrected scanning transmission electron microscopes (Masashi Watanabe, Lawrence Berkeley National Laboratory, USA), and the recently introduced technique of X-ray microtomography (Ryuichi Shimizu, Osaka Institute of Technology, Japan). The aim is to show that new X-ray microanalysis methods continue to be developed to meet the characterisation needs of researchers in a wide range of fields from microelectronics to mineralogy. New microbeam developments will also be welcomed into this sessions.
S-06 Advances in SIMS Technologies and Applications
Third-generation SIMS instruments have fostered new applications in biological, environmental and planetary science where high spatial/mass resolution or molecular information are required. NanoSIMS has made it possible to map elemental and isotopic tracers in biological samples at sub-cellular scale. Complex molecular information can be obtained from thin organic films and biological surfaces by TOF-SIMS. Larger SIMS instruments including SHRIMP and ims1280 integrate multiple collection, high mass resolution and high sensitivity, permitting stable isotope ratio measurements with better precision. Hybrid designs merge SIMS and AMS, making isotope ratio measurements possible for extremely small samples. This session will focus on developments in SIMS and their application. Claude Lechene of Harvard will present the state-of-the-art in biological SIMS applications.
S-07 Cryo-EM (TEM & FESEM)
Cryotechniques in TEM and SEM have allowed the microstructure of hydrated biological and other materials to be studied in conditions as close as possible to their in vivo state. This session will cover advances in 3D reconstruction using cryo-electron tomography, electron crystallography and single particle analysis and SEM techniques combined with computational analysis of the data. Invited presentations by Steve Ludtke, National Centre for Macromolecular Imaging, Texas, USA, and Alok Mitra, from the University of Auckland, will lead this session. Contributions in all of these areas and on research related to them are welcome.
S-08 Micro-CT and X-ray Microscopy
X-ray based microscopy technologies are emerging as one of the most dynamic areas of modern microscopy. The developments over the last decade have widened the field of application to a point where X-ray micro-tomography and other X-ray analytical techniques are being applied in areas as diverse as medicine, mining, entomology and archaeology. More significantly the maturity of the technology is now driving the development of both quantitative approaches and model based analysis such as Finite Element Analysis (FEA) of complex materials. This session will showcase this emergent technology and some of these application areas.
S-9,10 David Cockayne Symposium on Advances in Materials Microscopy
The Symposium is to honour the decades of stellar contributions made to Australian Microscopy by Professor David Cockayne. He provided leadership in the national University sector by building the EMU at Sydney University into the Australian Key Centre for Microscopy and Microanalysis, thereby producing a successful model. Through his high academic standards his students have progressed to leading positions around the world. Professor Cockayne also made time for the (then) Australian Society for Electron Microscopy Inc by serving as its Founding President and he followed this up more recently with the Presidency of the International Federation of Societies for Microscopy. These efforts, together with a number of long-standing international microscopy journal editorial roles, have been important in developing the high regard in which Australian microscopy is held internationally. Submissions by past students and colleagues to this Special Symposium are invited to complement an invited presentation by David Cockayne.
S-11 High Resolution / Low Voltage SEM with Electron and Ions
Sub-nanometre resolution and imaging with Helium ion sources are amongst the leading recent developments in this field. David Joy, from Oak Ridge National Laboratory, will present new data from the He ion scanning microscope. Other presentations will address the status of image resolution in the SEM and how we define and monitor it and also the challenge of applying thin film coatings suitable for high resolution imaging to our samples. Papers including high resolution and low voltage applications in all fields are invited.
S-12 Fluorescence Quantitation and Sensing Techniques and their biological applications (FRET, FLIM, Multiphoton etc)
This session will broadly cover fluorescence microscopy and the specific fluorescence modalities (including wide-field, confocal, multiphoton, FRET, FLIM, TIRF) that support intracellular studies. Presentations will involve advances in microscopy and digital technologies, biophysics, protein & probe chemistry, and any applications (eg, cell signalling) that involve these areas.
S-13 Microscopy, self-assembly and surface chemistry
The "bottom-up" approach to the fabrication of novel nanomaterials and devices for applications ranging from energy production to drug delivery and tissue engineering, relies largely on the recent advances in chemistry, especially in self-assembly and surface chemistry. These advances have allowed chemists to make larger and larger well-defined nanoscale structures, pushing the envelope for the characterisation of these systems. At the same time, advances in high-resolution microscopy, including scanning probe techniques (AFM and STM), TEM, SEM and fluorescence microscopy, have allowed chemists to routinely study (sub)-molecular structures and measure single molecule processes and properties ranging from conductivity to catalysis. The session will cover a range of topics related to applications of microscopy in self-assembly and surface chemistry and contributions to this area of microscopy research are most welcome.
S-14 Variable Pressure SEM, ETEM & ESEM
The variable pressure environment in SEM and TEM is being used to develop an increasing range of new and novel application and this session will address these. Niels de Jonge, from the Oak Ridge National Laboratory, will present his recent field emission ESTEM results on nanometre-size particles suspended in water and his progress towards in situ tomography at room temperature. E-beam deposition and lithography applications and VPSE detector improvements aimed at high resolution low voltage imaging will also be presented and reviewed. Contributions on any VPSEM, ESEM and ETEM application are welcomed.
S-15 Spectral Imaging and Multivariate Analysis
Comprehensive data collection though full spectrum acquisition in x-ray maps is now routinely available. The tools to ÔmineÕ the critical information from these data cubes is complex and sophisticated, ie we need to know what we are doing. Complementing the full spectrum acquisition by adding a further dimension is the integration with FIB techniques, where data is collected from a sequentially sliced or milled sample. A range of multivariate analysis approaches are being utilised to provide interpretable outcomes from these growingly immense data sets. Contributions on this area are invited.
S-16 Structure and function at different length scales
This session will cover experimental and theoretical aspects of structural retrieval and modelling from sub-nanometer to micron scales. Some examples are atomic resolution imaging using using elastic and inelastic scattering, disorder on the nanoscale, structure and dynamics of defects, dislocations and grain boundaries.
S-17 Developments in X-ray Detection in Electron Microscopy
The technology of x-ray detection has recently been progressing at a very high rate. The new generation of Silicon drift detectors achieve resolutions matching those of conventional Si(Li) variants. The developments are not restricted to the this area alone as complimentary improvements in wavelength dispersive spectrometers are allowing precise characterisation of the density-of-state of surfaces, for example. Dale Newbury, from NIST in Washington, USA, is reknown for having his finger on the pulse in this area, as it forms part of the NIST mandate. Dale will give a Ôstate-ofÕthe-artÓ presentation on the Si drift detector status. Further contributions in this and related areas, particularly with respect to novel applications, are invited.
S-18 Shared Data and Remote Microscopy - the time has come?
Remote access and use of state of the art electron microscope and surface analysis equipment has become common practice over the last decade or so. What is not so well defined and managed is the storage, management, manipulation and presentation of data acquired in both remote access sessions and in collaborative research in general. There are a number of efforts across the world that seek to address the effective storage, access and manipulation of data. Although this session will review the current status of remote control and remote access projects, it will predominantly focus on collaborative data storage and handling, with reference to Grid enabled technologies, wikis, blogs and shared annotation services.
S-19 3-D Atom Probe Tomography
Recent advances in instrumentation technology (laser-pulsing, wide field of view detectors etc) in combination with the development of new sample preparation methods (site-specific FIB fabrication) have made considerable impact on Atom Probe Tomography (APT), significantly improving mass resolution, data acquisition rates and the range of problems and materials to which the technique is applicable. Thomas Kelly, founder of Imago Scientific Instruments, a world leader in APT, will present aspects of his cutting-edge APT research and development, including laser-assisted atom probe and new applications. Papers on APT instrumentation, data analysis, sample preparation, materials applications etc. are invited.
S-20 In situ CL Spectroscopy and Imaging
Scanning cathodoluminescence microscopy and spectroscopy currently plays an important role in the study of technologically important semiconductors, ceramics and geological materials. Recent advances in SEM, providing enhanced low voltage performance and variable pressure operation, in conjunction with improvements in light detection technologies have considerably enhanced the microanalytical capabilities of the CL technique and expanded its range of applications. The improvement in CL spatial resolution is of particular significance as it has opened the door for CL characterisation of nano-structures and nano-materials. This symposium will cover CL studies of opto-electronic and geological materials, low voltage CL microscopy and spectroscopy, CL interpretation using Monte Carlo techniques, CL microanalysis in the VPSEM, emerging CL instrumentation and techniques and CL analysis of nano phase materials and structures. Contributed papers as are welcome.
S-21 Scanned Probe Technologies
Scanning probe microscopes have become a valuable tool in surface science, physics, chemistry engineering and life sciences. Hadi Zareie, from the University of Technology Sydney, will provide inspiration with a presentation on cutting edge materials SPM applications. Contributions are welcome in all aspects of scanning probe technologies including, high resolution imaging, surface force measurements, nanoscale manipulation and nanolithography.
S-22 Nanomaterials and Thin Films
Nanoscale materials and thin films exhibit physical behaviours that deviate substantially from bulk materials of similar composition. Behaviour can be tailored by engineering structures of specific size, shape, surface area, porosity, layering, and composition. TEM and other microscopy techniques play a fundamental role in understanding these systems. Nanomaterials and thin films are finding applications in almost every sphere of technological endeavour, including catalysis, filtration, energy production, medical diagnostics, drug delivery, electronics, etc. This session will address the engineering and characterisation challenges that are becoming ever more difficult as physical dimensions of nanomaterials and thin films are reduced. We welcome contributions.
S-23 Specimen Preparation in Biological Sciences
Sample processing is at the heart of all microscopy of biological specimens. The end result is totally dependent on the preparation, with the aim being to reduce the artefacts as much as possible in order to get a true picture of the sample. All specimens must be processed in some way and the types specimen processing can be varied. We will cover a range of techniques from cryo techniques to the use of microwaves as well as new improvements on the more routine chemical processing protocols and will highlight their application to a range of sample types.
S-24 Forensic Microscopies
The Judiciary relies on forensic scientists to assist them in adjudication of matters before them. Optical microscopy and micro-analytical techniques have been used on trace materials by forensic scientists to establish an association between samples and putative sources. To enhance scrutiny and discrimination, analytical techniques are required with greater spatial resolution and high sensitivity with rapid analysis. Furthermore, the techniques should be non-destructive with little, if any, sample preparation. Recent forensic applications in ToF-SIMS, laser ablation-ICP-MS and synchrotron radiation present analytical techniques that wholly or in part fulfil the requirements for sensitive analysis, reliable comparisons and sample integrity.
S-25 Mineral Chronology and Trace Element Microanalysis with Electrons, Lasers and Ions
With new analytical techniques, refinement of old techniques, new minerals to date and improved instrumentation, the petrogenesis and geochronology of accessory phases is at the forefront of geological research. Michael Williams, of the University of Massachusetts, is expected present new information on the development of electron microprobe dating of monazite and xenotime and its application in defining the timing, rates and durations of geological processes. Contributions on developments in instrumentation, techniques and applications with ion probes, electron probes and lasers are welcomed.
S-26 Analytical Microscopy in Biology / Biomedicine
The localisation and quantitation of elements in cells and biological fluids continues to be an important area of research. Progress in the development and application of electron probe x-ray microanalysis, particularly the rapid acquisition of data on a pixel by pixel basis, and comparisons with x-ray probe x-ray microanalysis (synchotron) will be reviewed by Peter Ingram from Duke University, USA. Other contributions will include progress in developing low voltage methods of x-ray microanalysis of biological samples by Alan Marshall. Contributions on methods and applications of any area of analytical microscopy e.g. x-ray microanalysis and electron energy loss spectroscopy, are invited.
S-27 Structural Biology and Immunocytochemistry
Many advances in the clarification of structureÐfunction relationships at the cellular and tissue level have occurred when structural biology and immunocytochemistry techniques were applied concurrently. This session will provide a forum for biomolecular microscopists across disciplines and will focus on the application of advanced structural biology imaging techniques combined with fine structure immunocytochemistry. Any microscopy contribution in which labelling of cells and tissues with antibodies, probes, fluoronanogold constructs, fluorescent labelled proteins and / or genes played a key role in their research quest are invited.
S-28 Microscopy in Plant Biology
As in other biological disciplines, advances in microscopy have allowed many new insights into plant structure and function. This broad-ranging session will highlight applications of SEM, TEM, confocal and analytical microscopy, e.g. FTIR microscopy, x-ray microanalysis, x-ray CT, to plant tissues. The emphasis will be on advances in our understanding of plant cell and tissue dynamics, ultrastructure and composition that have been enabled by new advances in the analytical tools of microscopy. Contributions are welcome.
S-29 Microscopy and Microanalysis of Irradiated and Radioactive Materials
Materials in extreme radiation environments (space, nuclear reactors, synchrotrons and/or containing radioactive species and/or deliberately modified using ion beams) often undergo changes in nano/micro-structure and nano/micro-chemistry that cause changes to their macroscopic performance and properties. In this symposium we will feature speakers, including Clive Walker from The European Commission Institute for TransUranium Elements, Germany, who have studied the effects of various forms of radiation on materials using electron column instrumentation and/or have developed and used preparation and examination methodologies for radioactive specimens. Contributed papers are sought which address: dose dependent microstructural evolution; synergies between microstructural changes and macroscopic properties and/or methodologies of relevance.
S-30,31 Microscopy and Microanalysis assisting Industry
Industry in Australia is a major part of our economic success and worldwide recognition. These industries are varied and include alumina, iron, base metals, pigments, fertilizers, cement, forensics, medicine, pharmaceutical and countless others. Industry uses microscopy and microanalysis techniques to find a solution to specific problems, to improve processes, provide quality assurance on a nano-scale and through non-destructive analysis with ppm sensitivity. Gerald Roach, Alcoa World Alumina, will present an industry perspective of these techniques in use. We invite presentations from all types of industry to showcase the variety and depth of the requirements and techniques in use today.
S-32 Microscopy, Viruses and Diseases
The world is in a constant state of change. These changes present new challenges in respect to safe-guarding a countries economy and society. To predict and respond to the impacts of change there is an increasing need to understand the range of viruses within the environment, their structure, replication strategies and threat to our well-being. This session addresses these areas in addition to presenting advances which have the potential to study the pathogenesis of disease such as gene silencing and correlative live-cell imaging and electron microscopy. Mark Ellisman, from the National Center for Microscopy and Imaging Research, University of California - San Diego, will present his recent work on advances in correlative light and electron microscopy to lead off this session. Further contributions on this theme as invited and welcomed.
S-33 Advances in STEM, HREM & EELS
Developing our understanding of the correlation between atomic structure, composition and electronic structure is important to understanding and designing new materials. Recent years have seen major advances in both instrumentation and theoretical techniques. These include aberration correctors, monochromators, new tomographic techniques and phase retrieval approaches. Many new computational methods are also being developed for the theoretical interpretation of images and spectra. Nigel Browning from Lawrence-Livermore Berkeley Laboratory, California, USA, and Ian Andersen from NIST, USA, will be presenting their latest work, to get us going. This session welcomes contributions describing such new developments in STEM, HREM or EELS (including EFTEM) and/or their application.
S-34 Forum on Teaching and Training in Microscopy
Microscopy and Microanalysis are rapidly becoming turn-key solutions. The user-interfaces are ÔsoftÕ and anyone can use a modern instrument with minimal skills. A compounding problem is the outcomes-based focus we are encouraged to adopt. This symposium welcomes contributions that address the teaching and training needs of our community. Luc Harmsen, from Anaspec, South Africa, faces these needs almost daily and will present his experienced viewpoint. At the other end of the pole we will have the highly experienced John Mansfield, from the University of Michigan, USA, and Raynald Gauvin, from McGill University, Canada, outlining their approaches. Come and add to the discussion Ð should we teach users how they work, or not?
S-35 Characterisation of Implanted Structures and Materials
Ion implantation is fundamental to materials science research and the semiconductor industry. The ions induce electrical, chemical, structural and other useful physical changes to the surface and buried layers of any material. A swift single ion passing through a material represents the ultimate machine tool for nanotechnology with materials modification at the sub-50nm scale possible. In the 21st century ion implantation is finding new roles in the fabrication of quantum devices that use single atoms as the smallest functional components. Characterisation of these devices presents unique challenges. Recent results presented in this session show how these challenges are being met.
S-36 Particle Analysis and Characterisation
Particles are important, or at least so many think. They are important environmental indicators and have major value in the forensic sciences. Once we have decided what a particle is, then remains the two next steps: (i) how do we find them, and once found (ii) how do we characterise them. The finding of a particle becomes more difficult as the particle size diminishes. We are challenged by particle search definition and then the evaluation of our effectiveness. Further, once found, has our characterisation or sampling process changed the particle nature? This symposium invites contributions on these location and characterisation challenges. Novel and or challenging applications are particularly encouraged.
S-37 Image Enhancement and Analysis
Images remain the base data set for most microscopy applications. Fast computing technologies provide access to a range of new methods of handling these data sets. In this session we welcome contributions on new software tools and approaches to image enhancement and image analysis, including novel applications not covered elsewhere.
S-38 50 Years of the Cowley-Moodie Multislice Theory
The power of electron microscopy in scientific research lies in the extremely strong interaction of electrons with matter. This interaction, however, also made accurate description of electron scattering a formidable problem that denied fuller exploitation of electron microscopy. This session celebrates the 50th anniversary of the solution to this problem by John Cowley and Alex Moodie. They brought to the world an analytical and canonical description of N-beam scattering now known throughout microscopy, crystallography and materials science as the "Multislice" formalism. This monumental contribution to physical optics has gone well beyond electron diffraction and microscopy and into X-ray and visible light scattering. The achievements of Cowley and Moodie gave Australia leadership in the fields of electron microscopy and crystallography and were recognised by the International Union of Crystallography through the inaugural Ewald Prize in 1987. We are very fortunate to have Prof. Alexander F. Moodie, FAA, and Prof. David Cockayne, FRS, as invited speakers in this session. Contributions are welcome in any area of research that has benefited from or further developed the Multislice approach, including analytical theory and practical applications.
Confirmed invited speakers (as of Sept 14, 2007):
Speaker
|
Affiliation
|
Joe Michael | Sandia National Laboratory, New Mexico, USA |
Mark Ellisman | National Center for Microscopy and Imaging Research, University of California, San Diego, USA |
Peter Hunter | University of Auckland, New Zealand |
Raynald Gauvin | McGill University, Quebec, Canada |
Silvia Richter | University of Aachen, Germany |
Masashi Watanabe | Lawrence-Livermore Berkeley Laboratory, California, USA |
Ryuchi Shimizu | Osaka Institute of Technology, Japan |
Steve Ludtke | National Centre for Macromolecular Imaging, Texas, USA |
Alok Mitra | University of Auckland, New Zealand |
David Cockayne | Dept of Materials, Oxford University , UK |
David Joy | University of Tennessee, Knoxville, USA |
Niels de Jonge | Oak Ridge National Laboratory, Oak Ridge and Vanderbilt University, Nashville, USA USA |
Dale Newbury | NIST, Washington, USA |
John Mansfield | University of Michigan, Michigan, USA |
Nestor Zaluzec | Argonne National Laboratory, Illinois, USA |
Tom Kelly | Imago Scientific Instruments, Wisconsin, USA |
Dominique Drouin | University of Sherbrooke, Quebec, Canada |
Peter Ingram | Duke University and Veterans Affairs Medical Centers, North Carolina, USA |
Alan Marshall | CSIRO, Geelong, Australia |
Anne LeFurgey | Duke University and Veterans Affairs Medical Centers, North Carolina, USA |
Clive Walker | The European Commission - Institute for Transuranium Elements, Germany |
Gerald Roach | Alcoa World Alumina, Perth, Australia |
Mary Ng | National University of Singapore, Singapore |
Nigel Browning | Lawrence-Livermore Berkeley Laboratory, California, USA |
Ian Anderson | NIST, Washington, USA |
Luc Harmsen | Anaspec, Johannesburg, South Africa |
David Jamieson | University of Melbourne, Australia |
Prof Barry Carter | University of Connecticut |
Dr Scott Wight | NIST |
Dr Francois Hillion | CAMECA |
Dr Michael O'Keefe | President, MSA |
Dr Michael Miller | Oak Ridge National Laboratory |
Prof Alex Moodie | FAA, RMIT and Monash University |
Dr Paul Carpenter | University of Washington |
Dr Mark Oxley | Oak Ridge National Laboratory |
Prof. Hamish Fraser | Ohio State University |
Dr David Steele | University of Edinburgh |
Professor Christian Colliex | Centre National de la Recherche Scientifique, UniversitŽ Paris-Sud |
Prof Anne LeFurgey | Duke University and Veterans Affairs Medical Centers, North Carolina, USA |
Prof Claude Lechene | National Resource for Imaging Mass Spectrometry,MA, USA |
|
Tentative
|
Dr Ed Vicenti | Smithsonian Museum of Natural History |
Dr Paul Midgley | Cambridge University |
Prof Mark Kay | Stanford University |
Dr Hans Kruseman | FEI Compnay |
Invited tutorial topics
The invited tutorials are intended to be comprehensive introductions to specific core areas of microscopy. We have invited some of the internationally-leading experts to complement their plenary presentations with their own overview.
The tutorials are very special events. Whilst most of us can present the basics in many areas of microscopy, very few of us have the insight from being involved in the actual evolution of these methodologies and technologies. Our presenters come from this group.
The topics will covered at a level and depth of relevance to those wishing to understand what the methodology or technology can provide, how it does that, and what the limitations are. In relevant cases the complementary microscopies will also be identified, together with suitable correlative techniques.
|
Topic
|
Presenter
|
A Beginner's Guide to Atom Probe | Tom Kelly, IMAGO |
Essentials of Biological Microanalysis | Peter Ingram, Duke University |
Monte Carlo Modelling | David Joy, University of Tennessee, Knoxville |
Problems encountered in EDS analysis | Dale Newbury, NIST |
FIB methods and applications i.e., FIB-EPMA/ FIB-SIMS | Joe Michael / John Mansfield |
Basic tomography and image reconstruction in biomedicine | Brad Marsh, University of Queensland |
What are SPM and what do they do for us? | John Thomas |
FLIM-FLAM and multi-photon microscopy Ð harmony or coincidence | Ian Harper, Monash University |